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=== Data analysis ===
=== Data analysis ===
* Fast profile reconstruction using [[Function parametrization]]<ref>[http://dx.doi.org/10.1016/0010-4655(91)90073-T B.Ph. van Milligen, N.J. Lopes Cardozo, ''Function Parametrization: a fast inverse mapping method'', Comp. Phys. Commun. '''66''' (1991) 243]</ref><ref>[http://iopscience.iop.org/0029-5515/31/2/007 B.Ph. van Milligen et al., ''Application of Function Parametrization to the analysis of polarimetry and interferometry data in TEXTOR'', Nucl. Fusion '''31''' (1991) 309]</ref>
* Fast profile reconstruction using [[Function parametrization]]<ref>[http://dx.doi.org/10.1016/0010-4655(91)90073-T B.Ph. van Milligen, N.J. Lopes Cardozo, ''Function Parametrization: a fast inverse mapping method'', Comp. Phys. Commun. '''66''' (1991) 243]</ref><ref>[http://iopscience.iop.org/0029-5515/31/2/007 B.Ph. van Milligen et al., ''Application of Function Parametrization to the analysis of polarimetry and interferometry data in TEXTOR'', Nucl. Fusion '''31''' (1991) 309]</ref>
* [[Bayesian data analysis]] <ref>B.Ph. van Milligen, T. Estrada, E. Ascasíbar, et al, ''Integrated data analysis at TJ-II: the density profile'', Rev. Sci. INstrum. (2011) Accepted for publication</ref>
* [[Bayesian data analysis]] <ref>B.Ph. van Milligen, T. Estrada, E. Ascasíbar, et al, ''Integrated data analysis at TJ-II: the density profile'', Rev. Sci. Instrum. (2011) Accepted for publication</ref>
* [[Biorthogonal decomposition]]
* [[Biorthogonal decomposition]]
* Analysis and interpretation of diagnostic output, e.g., [[TJ-II:Thomson Scattering|Thomson Scattering]]<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>, [[TJ-II:Reflectometry|Reflectometry]], [[TJ-II:Interferometry|Interferometry]], [[TJ-II:Electron Cyclotron Emission|Electron Cyclotron Emission]], [[TJ-II:Heavy Ion Beam Probe|Heavy Ion Beam Probe]], [[TJ-II:Magnetics|Magnetics]], [[TJ-II:Langmuir Probes|Langmuir Probes]]
* Analysis and interpretation of diagnostic output, e.g., [[TJ-II:Thomson Scattering|Thomson Scattering]]<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>, [[TJ-II:Reflectometry|Reflectometry]], [[TJ-II:Interferometry|Interferometry]], [[TJ-II:Electron Cyclotron Emission|Electron Cyclotron Emission]], [[TJ-II:Heavy Ion Beam Probe|Heavy Ion Beam Probe]], [[TJ-II:Magnetics|Magnetics]], [[TJ-II:Langmuir Probes|Langmuir Probes]]

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