TJ-II:Thomson Scattering: Difference between revisions

TJ-II:Thomson Scattering (view source)

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 The high-resolution Thomson Scattering system provides electron temperature, density, and pressure profiles at a single time in the discharge.
-<ref>C. J. Barth et al. Rev. Sci. Instruments, Vol. '''70''', Nº 1, 763-767 (1999)</ref>
+<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C. J. Barth et al. Rev. Sci. Instruments, Vol. '''70''', Nº 1, 763-767 (1999)]</ref>
 <ref>J. Herranz et al. Fus. Eng. And Design, '''65''' (2003) 525-536</ref>
-<ref>C. J. Barth et al. Rev. Sci. Instruments, Vol. '''72''', Nº 9, 3514-3527 (2001)</ref>
+<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C. J. Barth et al. Rev. Sci. Instruments, Vol. '''72''', Nº 9, 3514-3527 (2001)]</ref>
 <ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
 The number of data points along the profiles can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.