TJ-II:Reflectometry: Difference between revisions
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== Profile Reflectometer == | |||
TJ-II has an AM reflectometer | TJ-II has an AM reflectometer | ||
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref> | <ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref> | ||
| Line 4: | Line 6: | ||
(located between [[TJ-II:Sectors|sectors]] A4 and A5). | (located between [[TJ-II:Sectors|sectors]] A4 and A5). | ||
== Fluctuation Reflectometer == | |||
A fast frequency hopping reflectometer | |||
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | <ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | ||
working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry) | working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry) | ||
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref> | <ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref> | ||
. | . | ||
== Doppler Reflectometer == | |||
[[File:DRscheme.jpg|200px|thumb|right|Schematic drawing of the Doppler Reflectometer System of TJ-II.]] | [[File:DRscheme.jpg|200px|thumb|right|Schematic drawing of the Doppler Reflectometer System of TJ-II.]] | ||
Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra. | Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra. The system is able to measure in a radial range of about ρ = 0.6 - 0.9 (ρ=r/a is the effective radius) and the perpendicular wavenumber can be selected between 3 and 15 cm<sup>-1</sup>. | ||
==References== | ==References== | ||
<references /> | <references /> | ||
Revision as of 16:52, 22 July 2009
Profile Reflectometer
TJ-II has an AM reflectometer [1] for measuring electron density profiles with a temporal resolution of 2 ms (located between sectors A4 and A5).
Fluctuation Reflectometer
A fast frequency hopping reflectometer [2] working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in perpendicular incidence (conventional reflectometry) [3] .
Doppler Reflectometer
Since February 2009, the frequency hopping system is in operation in oblique incidence (Doppler reflectometry, sector C6) [4], measuring plasma density fluctuation velocities and their wave number spectra. The system is able to measure in a radial range of about ρ = 0.6 - 0.9 (ρ=r/a is the effective radius) and the perpendicular wavenumber can be selected between 3 and 15 cm-1.
References
- ↑ T. Estrada et al., Plasma Phys. Control. Fusion 43 (2001) 1535–1545
- ↑ L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. 75 (2004) 3865
- ↑ T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion 46 (2006) S792–S798
- ↑ T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. 80 (2009) 073502