TJ-II:Reflectometry: Difference between revisions

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was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry)
was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry)
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref>
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref>
. Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra.
. Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra.


==References==
==References==
<references />
<references />

Revision as of 16:22, 22 July 2009

TJ-II has an AM reflectometer [1] for measuring electron density profiles with a temporal resolution of 2 ms (located between sectors A4 and A5).

Apart from that, a fast frequency hopping reflectometer [2] was used from 2004 - 2008 in perpendicular incidence (conventional reflectometry) [3] . Since February 2009, the frequency hopping system is in operation in oblique incidence (Doppler reflectometry, sector C6) [4], measuring plasma density fluctuation velocities and their wave number spectra.

References