TJ-II:Reflectometry: Difference between revisions

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TJ-II has an AM reflectometer
TJ-II has an AM reflectometer
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref>
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref>
for measuring electron density profiles with a temporal resolution of 2 ms. Apart from that, a fast frequency hopping reflectometer
for measuring electron density profiles with a temporal resolution of 2 ms  
(located between [[TJ-II:Sectors|sectors]] A4 and A5).  
 
Apart from that, a fast frequency hopping reflectometer
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref>
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref>
was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry)
was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry)

Revision as of 15:46, 22 July 2009

TJ-II has an AM reflectometer [1] for measuring electron density profiles with a temporal resolution of 2 ms (located between sectors A4 and A5).

Apart from that, a fast frequency hopping reflectometer [2] was used from 2004 - 2008 in perpendicular incidence (conventional reflectometry) [3] . Since February 2009, the frequency hopping system is in operation in oblique incidence (Doppler reflectometry) [4], measuring plasma density fluctuation velocities and their wave number spectra.

References