TJ-II:Heavy Ion Beam Probe: Difference between revisions

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[[File:HIBP.png|342px|thumb|right|HIBP probe, photo and diagram]]
[[File:TJ-II_HIBP_diagram.png|350px|thumb|right|HIBP probe diagram]]


The advanced Heavy Ion Beam Probe can simulataneously measure the plasma electric potential ''&phi;'', the electron density ''n<sub>e</sub>'', the electron temperature ''T<sub>e</sub>'', and a poloidal magnetic field component ''B<sub>p</sub>'' at a point inside the plasma.
The advanced Heavy Ion Beam Probe can simulataneously measure the plasma electric potential ''&phi;'', the electron density ''n<sub>e</sub>'', the electron temperature ''T<sub>e</sub>'', and a poloidal magnetic field component ''B<sub>p</sub>'' at a point inside the plasma.
<ref>L.I. Krupnik et al., Fusion Engineering and Design '''56-57''' (2001) 935</ref>
<ref>L.I. Krupnik et al., Fusion Engineering and Design '''56-57''' (2001) 935</ref>
<ref>I.S. Bondarenko et al., Rev. Sci. Instrum. '''72''', 583 (2001)</ref>
<ref>I.S. Bondarenko et al., Rev. Sci. Instrum. '''72''', 583 (2001)</ref>
This point can be scanned through the plasma cross-section by varying the deflection potentials.
This point can be scanned through the plasma cross-section by varying the deflection potentials (active beam control).


== References ==
== References ==
<references />
<references />

Revision as of 15:40, 16 July 2009

HIBP probe diagram

The advanced Heavy Ion Beam Probe can simulataneously measure the plasma electric potential φ, the electron density ne, the electron temperature Te, and a poloidal magnetic field component Bp at a point inside the plasma. [1] [2] This point can be scanned through the plasma cross-section by varying the deflection potentials (active beam control).

References

  1. L.I. Krupnik et al., Fusion Engineering and Design 56-57 (2001) 935
  2. I.S. Bondarenko et al., Rev. Sci. Instrum. 72, 583 (2001)