LNF:Technology: Difference between revisions

LNF:Technology (view source)

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 ===Secondary Ion Mass Spectrometry (SIMS)===
 [[File:Foto0288.jpg|300px|thumb|right|SIMS]]
-SIMS: Hiden Analytical secondary ion mass spectroscopy equipment using oxygen or argon ions as primary ions with an energy of 5 keV. Mass identification (1 to 550 amu), depth profiling and static SIMS capabilities. The system is also useful for compositional mapping and it incorporates an electron gun for SIMS experiments in insulating materials. The electronegative ions can be better detected using a Cs ion gun, with an energy up to 5 keV.
+This Hiden Analytical secondary ion mass spectroscopy system uses oxygen or argon ions, with an energy of 5 keV, as the primary ions. Mass identification (1 to 550 amu), depth profiling and static SIMS capabilities are available. The system is also used for compositional mapping and it incorporates an electron gun for SIMS experiments in insulating materials. Electro-negative ions can be better detected using a Cs ion gun with an energy up to 5 keV.