TJ-II:Thomson Scattering: Difference between revisions

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provides electron temperature, density, and pressure profiles at a single time in the discharge.
provides electron temperature, density, and pressure profiles at a single time in the discharge.
<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
<ref>J. Herranz et al. Fus. Eng. And Design, '''65''' (2003) 525-536</ref>
<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>
<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
The number of data points along the profiles can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.
The number of data points along the profiles can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.

Revision as of 17:34, 9 August 2009

The Thomson Scattering diagnostic at TJ-II

The high-resolution Thomson Scattering system (located in sector D2) provides electron temperature, density, and pressure profiles at a single time in the discharge. [1] [2] [3] [4] [5] The number of data points along the profiles can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm. Signal names in the TJ-II database: 'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'.


References

  1. ↑ C.J. Barth et al, High-resolution multiposition Thomson scattering for the TJ-II stellarator, Rev. Sci. Instruments, Vol. 70, 1 (1999) 763-767
  2. ↑ C.J. Barth et al, Calibration procedure and data processing for a TV Thomson scattering system, Rev. Sci. Instruments, Vol. 72, 9 (2001) 3514-3527
  3. ↑ J. Herranz et al. Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI
  4. ↑ J. Herranz et al, The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II, Fus. Eng. And Design, 65 (2003) 525-536
  5. ↑ B.Ph. van Milligen et al, Revision of TV Thomson scattering data analysis and detection of profile structure, Rev. Sci. Instrum. 74 (2003) 3998
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