TJ-II:Reflectometry: Difference between revisions

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== Profile Reflectometer ==
TJ-II has an AM reflectometer
TJ-II has an AM reflectometer
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref>
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref>
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(located between [[TJ-II:Sectors|sectors]] A4 and A5).  
(located between [[TJ-II:Sectors|sectors]] A4 and A5).  


Apart from that, a fast frequency hopping reflectometer
== Fluctuation Reflectometer ==
 
A fast frequency hopping reflectometer
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref>
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref>
working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry)
working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry)
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref>
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref>
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== Doppler Reflectometer ==
[[File:DRscheme.jpg|200px|thumb|right|Schematic drawing of the Doppler Reflectometer System of TJ-II.]]
[[File:DRscheme.jpg|200px|thumb|right|Schematic drawing of the Doppler Reflectometer System of TJ-II.]]
Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra.
Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra. The system is able to measure in a radial range of about &rho; = 0.6 - 0.9 (&rho;=r/a is the effective radius) and the perpendicular wavenumber can be selected between 3 and 15 cm<sup>-1</sup>.


==References==
==References==
<references />
<references />

Revision as of 15:52, 22 July 2009

Profile Reflectometer

TJ-II has an AM reflectometer [1] for measuring electron density profiles with a temporal resolution of 2 ms (located between sectors A4 and A5).

Fluctuation Reflectometer

A fast frequency hopping reflectometer [2] working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in perpendicular incidence (conventional reflectometry) [3] .

Doppler Reflectometer

Schematic drawing of the Doppler Reflectometer System of TJ-II.

Since February 2009, the frequency hopping system is in operation in oblique incidence (Doppler reflectometry, sector C6) [4], measuring plasma density fluctuation velocities and their wave number spectra. The system is able to measure in a radial range of about ρ = 0.6 - 0.9 (ρ=r/a is the effective radius) and the perpendicular wavenumber can be selected between 3 and 15 cm-1.

References