TJ-II:Thomson Scattering: Difference between revisions
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(Created page with 'The high-resolution Thomson Scattering system. <ref>C. J. Barth et al. Rev. Sci. Instruments, Vol. 70, Nº 1, 763-767 (1999)</ref> <ref>J. Herranz et al. Fus. Eng. And Design, 65…') |
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Revision as of 10:33, 15 July 2009
The high-resolution Thomson Scattering system. [1] [2] [3] [4]
References
- ↑ C. J. Barth et al. Rev. Sci. Instruments, Vol. 70, Nº 1, 763-767 (1999)
- ↑ J. Herranz et al. Fus. Eng. And Design, 65 (2003) 525-536
- ↑ C. J. Barth et al. Rev. Sci. Instruments, Vol. 72, Nº 9, 3514-3527 (2001)
- ↑ J. Herranz et al. Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI