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TJ-II:Thomson Scattering: Difference between revisions
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[[File:Thomson.png|400px|thumb|right|The Thomson Scattering diagnostic at TJ-II]] | [[File:Thomson.png|400px|thumb|right|The Thomson Scattering diagnostic at TJ-II]] | ||
The high-resolution Thomson Scattering system provides electron temperature, density, and pressure profiles at a single time in the discharge. | The high-resolution Thomson Scattering system | ||
(located in [[TJ-II:Sectors|sector]] D2) | |||
provides electron temperature, density, and pressure profiles at a single time in the discharge. | |||
<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C. J. Barth et al. Rev. Sci. Instruments, Vol. '''70''', Nº 1, 763-767 (1999)]</ref> | <ref>[http://link.aip.org/link/?RSINAK/70/763/1 C. J. Barth et al. Rev. Sci. Instruments, Vol. '''70''', Nº 1, 763-767 (1999)]</ref> | ||
<ref>J. Herranz et al. Fus. Eng. And Design, '''65''' (2003) 525-536</ref> | <ref>J. Herranz et al. Fus. Eng. And Design, '''65''' (2003) 525-536</ref> | ||