4,378
edits
TJ-II:Thomson Scattering: Difference between revisions
Updated reference links
No edit summary |
(Updated reference links) |
||
| (4 intermediate revisions by 2 users not shown) | |||
| Line 4: | Line 4: | ||
(located in [[TJ-II:Sectors|sector]] D2, φ = 14.5°) | (located in [[TJ-II:Sectors|sector]] D2, φ = 14.5°) | ||
provides electron temperature, density, and pressure profiles at a single time in the discharge. | provides electron temperature, density, and pressure profiles at a single time in the discharge. | ||
<ref> | <ref>C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', [[doi:10.1063/1.1149399|Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]]</ref> | ||
<ref> | <ref>J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-Cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plasmas'', [[doi:10.1103/PhysRevLett.85.4715|Phys. Rev. Lett. '''85''' (2000) 4715]]</ref> | ||
<ref> | <ref>C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', [[doi:10.1063/1.1386896|Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]]</ref> | ||
<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref> | <ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref> | ||
<ref> | <ref>J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', [[doi:10.1016/S0920-3796(03)00387-9|Fus. Eng. And Design, '''65''' (2003) 525-536]]</ref> | ||
<ref> | <ref>B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', [[doi:10.1063/1.1597951|Rev. Sci. Instrum. '''74''' (2003) 3998]]</ref> | ||
The laser chord is inclined by 17° from the vertical. | The laser chord is inclined by 17° from the vertical. | ||
| Line 31: | Line 31: | ||
'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'. | 'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'. | ||
== Data analysis == | |||
Some progress has also been made in the field of data analysis. | |||
<ref>L. Makili, J. Vega, S. Dormido-Canto, et al., ''Upgrade of the automatic analysis system in the TJ-II Thomson Scattering diagnostic: New image recognition classifier and fault condition detection'', [[doi:10.1016/j.fusengdes.2009.10.004|Fusion Engineering and Design '''85''' (2010) 415–418]]</ref> | |||
<ref>S. Dormido-Canto, G. Farias, J. Vega, I. Pastor, ''Image processing methods for noise reduction in the TJ-II Thomson Scattering diagnostic'', [[doi:10.1016/j.fusengdes.2012.04.004|Fusion Engineering and Design (2012)]]</ref> | |||
== References == | == References == | ||
<references /> | <references /> | ||