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TJ-II:Multifilter electron temperature diagnostic: Difference between revisions
TJ-II:Multifilter electron temperature diagnostic (view source)
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<ref>[[doi:10.1063/1.4729669|D. Baião, F. Medina, M. Ochando, I. Pastor, C. Varandas, A. Molinero, and J. Chércoles, ''Implementation of a multichannel soft x-ray diagnostic for electron temperature measurements in TJ-II high-density plasmas'', Rev. Sci. Instrum. '''83''' (2012) 10E104]]</ref> | <ref>[[doi:10.1063/1.4729669|D. Baião, F. Medina, M. Ochando, I. Pastor, C. Varandas, A. Molinero, and J. Chércoles, ''Implementation of a multichannel soft x-ray diagnostic for electron temperature measurements in TJ-II high-density plasmas'', Rev. Sci. Instrum. '''83''' (2012) 10E104]]</ref> | ||
Its purpose is to obtain multichord electron temperature measurements in high density plasmas, where the [[TJ-II:Electron Cyclotron Emission|Electron Cyclotron Emission]] diagnostic is inoperative due to cutoff. | Its purpose is to obtain multichord electron temperature measurements in high density plasmas, where the [[TJ-II:Electron Cyclotron Emission|Electron Cyclotron Emission]] diagnostic is inoperative due to cutoff. | ||
This widely used technique is based on the determination of ''T<sub>e</sub>'' from the ratio of the SXR fluxes passing through filters of different thickness, assuming a Maxwellian electron energy distribution. The plasma impurity content plays an important role, since the presence of line radiation may distort the continuum SXR spectra. | |||
== See also == | == See also == | ||
[[TJ-II:Soft X-rays]] | * [[TJ-II:Soft X-rays]] | ||
* [[TJ-II:Thomson Scattering]] | |||
== References == | == References == | ||
<references /> | <references /> | ||