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TJ-II:Reflectometry: Difference between revisions
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== Profile Reflectometer == | == Profile Reflectometer == | ||
TJ-II has an AM reflectometer | [[TJ-II]] has an AM reflectometer | ||
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref> | <ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref> | ||
for measuring electron density profiles with a temporal resolution of 2 ms | for measuring electron density profiles with a temporal resolution of 2 ms | ||
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A fast frequency hopping reflectometer | A fast frequency hopping reflectometer | ||
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | <ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | ||
working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in [[TJ-II:Sectors|sector]] B8 in perpendicular incidence (''conventional'' reflectometry). The system allowed studies of the velocity shear layer in TJ-II | working in the Q-band (33 - 50 GHz) was used from 2004 - 2008 in [[TJ-II:Sectors|sector]] B8 in perpendicular incidence (''conventional'' reflectometry). The system allowed studies of the velocity shear layer in [[TJ-II]] | ||
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref> | <ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref> | ||
and of the radial position of its origin. | and of the radial position of its origin. | ||
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== Doppler Reflectometer == | == Doppler Reflectometer == | ||
[[File:DRscheme.jpg|200px|thumb|right|Schematic drawing of the Doppler Reflectometer System of TJ-II.]] | [[File:DRscheme.jpg|200px|thumb|right|Schematic drawing of the Doppler Reflectometer System of [[TJ-II]].]] | ||
Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra. The system is able to measure in a radial range of about ρ = 0.6 - 0.9 (ρ = r/a is the [[effective plasma radius]]) and the perpendicular wavenumber can be selected between 3 and 15 cm<sup>-1</sup>. | Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry, [[TJ-II:Sectors|sector]] C6) | ||
<ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref> | |||
, measuring plasma density fluctuation velocities and their wave number spectra. The system is able to measure in a radial range of about ρ = 0.6 - 0.9 (ρ = r/a is the [[effective plasma radius]]) and the perpendicular wavenumber can be selected between 3 and 15 cm<sup>-1</sup>. | |||
The system consists of a circular choked-corrugated antenna | The system consists of a circular choked-corrugated antenna | ||