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Diagnostics: Difference between revisions
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|Charge Exchange Recombination Spectroscopy || CXRS, CXS, CHERS, CER || Ion temperature <math>T_i</math>, toroidal and poloidal plasma rotation velocity <math>v_\phi</math>, <math>v_\theta</math>, impurity density <math>n_Z</math> | |Charge Exchange Recombination Spectroscopy || CXRS, CXS, CHERS, CER || Ion temperature <math>T_i</math>, toroidal and poloidal plasma rotation velocity <math>v_\phi</math>, <math>v_\theta</math>, impurity density <math>n_Z</math> | ||
|- | |- | ||
|Motional Stark Effect || MSE || Magnetic pitch angle <math>tan(\gamma) = B_\theta/B_\phi</math> | |Motional Stark Effect || MSE || Magnetic pitch angle <math>\tan(\gamma) = B_\theta/B_\phi</math> | ||
|- | |- | ||
|Electron Cyclotron Emission || ECE, ECEi || Electron temperature <math>T_e</math>, electron temperature fluctuations (turbulence) <math>\tilde{T}_e</math> | |Electron Cyclotron Emission || ECE, ECEi || Electron temperature <math>T_e</math>, electron temperature fluctuations (turbulence) <math>\tilde{T}_e</math> | ||
|- | |- | ||
|Mirnov coils, pickup coils || - || magnetic field components and fluctuations (outside plasma) | |Mirnov coils, pickup coils || - || magnetic field components and fluctuations (outside plasma) | ||
|- | |||
|Heavy Ion Beam Probe || HIBP || Electron density <math>n_e</math>, plasma potential <math>\phi</math> | |||
|- | |||
|Interferometry || - || Electron density <math>n_e</math> (line integral) | |||
|- | |||
|Polarimetry || - || Magnetic field pitch (line integral) | |||
|- | |||
|Reflectometry || - || Electron density <math>n_e</math> (edge profile, fluctuations) | |||
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A special bi-annual conference on fusion diagnostics is held in the U.S.: The [[Topical Conference on High Temperature Plasma Diagnostics]] (HTPD) | A special bi-annual conference on fusion diagnostics is held in the U.S.: The [[Topical Conference on High Temperature Plasma Diagnostics]] (HTPD) | ||
== References == | |||
* I.H. Hutchinson, ''Principles of Plasma Diagnostics'', Cambridge University Press; 2<sup>nd</sup> edition (2002) ISBN 978-0521803892 | |||