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TJ-II:Reflectometry: Difference between revisions
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TJ-II has an AM reflectometer | TJ-II has an AM reflectometer | ||
<ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref> | <ref>[http://dx.doi.org/10.1088/0741-3335/43/11/308 T. Estrada et al., Plasma Phys. Control. Fusion '''43''' (2001) 1535–1545]</ref> | ||
for measuring electron density profiles with a temporal resolution of 2 ms. Apart from that, a fast frequency hopping reflectometer | for measuring electron density profiles with a temporal resolution of 2 ms | ||
(located between [[TJ-II:Sectors|sectors]] A4 and A5). | |||
Apart from that, a fast frequency hopping reflectometer | |||
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | <ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | ||
was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry) | was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry) | ||