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TJ-II:Reflectometry: Difference between revisions
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for measuring electron density profiles with a temporal resolution of 2 ms. Apart from that, a fast frequency hopping reflectometer | for measuring electron density profiles with a temporal resolution of 2 ms. Apart from that, a fast frequency hopping reflectometer | ||
<ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | <ref>[http://link.aip.org/link/?RSINAK/75/3865/1 L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. '''75''' (2004) 3865]</ref> | ||
was used from 2004 - 2008 in perpendicular incidence (''conventional'' reflectometry) | |||
<ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref> | <ref>[http://dx.doi.org/10.1088/0029-5515/46/9/S14 T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion '''46''' (2006) S792–S798]</ref> | ||
. Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra. | . Since February 2009, the frequency hopping system is in operation in oblique incidence (''Doppler'' reflectometry) <ref>[http://link.aip.org/link/?RSINAK/80/073502/1 T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. '''80''' (2009) 073502]</ref>, measuring plasma density fluctuation velocities and their wave number spectra. | ||