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TJ-II:Thomson Scattering: Difference between revisions
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provides electron temperature, density, and pressure profiles at a single time in the discharge. | provides electron temperature, density, and pressure profiles at a single time in the discharge. | ||
<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref> | <ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref> | ||
<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plamsas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref> | |||
<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref> | <ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref> | ||
<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref> | <ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref> | ||