TechnoFusión: Difference between revisions

The implementation of a wide range of techniques for the detailed characterisation of commercial or locally developed materials is proposed, applied before, during, and after their exposure to radiation or heat loads. The characterisation techniques include mechanical techniques (electromechanical devices, miniature mechanical testing devices, thermal fluency testing devices, nano-indenting techniques, etc.), compositional techniques (Secondary Ions Mass Spectrometry (SIMS) and Atomic Probe Tomography (APT)), structural and microstructural techniques (High Resolution Transmission Electron Microscopy (HRTEM) and X-Ray Diffraction (XRD)), and material processing techniques (Focused Ion Beam Systems coupled to a Scanning Electron Microscope (FIB/SEM)). Various systems will be used to characterise physical properties (electrical, dielectric, optical, etc.). TechnoFusión aspires to become the national materials characterisation laboratory of reference, in view of the fact that some of the cited techniques, such as SIMS or APT, are not readily available in Spain.