TJ-II:Spectroscopy: Difference between revisions

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[[TJ-II]] disposes of an eight-channel, high-resolution, spectroscopic diagnostic system. This system is currently being used to measure impurity ion temperature and poloidal rotation using passive emission spectroscopy. The principal features of the diagnostic include independent focusing of its channels, high sensitivity for performing Doppler measurements in low-density [[TJ-II:Electron Cyclotron Resonant Heating|ECR-heated]] plasmas, as well as a flexible and fast in-house-developed software program for performing integrated data reduction and analysis.
[[TJ-II]] disposes of an nine-channel, high-resolution, spectroscopic diagnostic system. This system is currently being used to measure impurity ion temperature and poloidal rotation using passive emission spectroscopy. The principal features of the diagnostic include independent focusing of its channels, high sensitivity for performing Doppler measurements in low-density [[TJ-II:Electron Cyclotron Resonant Heating|ECR-heated]] plasmas, as well as a flexible and fast in-house-developed software program for performing integrated data reduction and analysis.
<ref>[http://link.aip.org/link/?RSINAK/72/971/1 A. Baciero et al, ''A multi-channel spectroscopic system for measuring impurity ion temperatures and poloidal rotation velocities in TJ-II'', Rev. Sci. Instrum. '''72''' (2001) 971]</ref>
<ref>[http://link.aip.org/link/?RSINAK/72/971/1 A. Baciero et al, ''A multi-channel spectroscopic system for measuring impurity ion temperatures and poloidal rotation velocities in TJ-II'', Rev. Sci. Instrum. '''72''' (2001) 971]</ref>
<ref>[http://www.new.ans.org/pubs/journals/fst/a_1264 B. Zurro et al, ''Comparison of Impurity Poloidal Rotation in ECRH and NBI Discharges of the TJ-II HELIAC'', Fusion Science and Technology '''50''', 3 (2006) 419-427]</ref>
<ref>[http://www.new.ans.org/pubs/journals/fst/a_1264 B. Zurro et al, ''Comparison of Impurity Poloidal Rotation in ECRH and NBI Discharges of the TJ-II HELIAC'', Fusion Science and Technology '''50''', 3 (2006) 419-427]</ref>
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