TJ-II:Reflectometry

TJ-II has an AM reflectometer ^[1] for measuring electron density profiles with a temporal resolution of 2 ms. Apart from that, a fast frequency hopping reflectometer ^[2]

was used from 2004 - 2008 in perpendicular incidence (conventional reflectometry)

^[3] . Since February 2009, the frequency hopping system is in operation in oblique incidence (Doppler reflectometry) ^[4], measuring plasma density fluctuation velocities and their wave number spectra.

References

↑ T. Estrada et al., Plasma Phys. Control. Fusion 43 (2001) 1535–1545
↑ L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. 75 (2004) 3865
↑ T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion 46 (2006) S792–S798
↑ T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. 80 (2009) 073502

[1] T. Estrada et al., Plasma Phys. Control. Fusion 43 (2001) 1535–1545

[2] L. Cupido, J. Sánchez and T. Estrada, Rev. Sci. Intrum. 75 (2004) 3865

[3] T. Estrada, E. Blanco, L. Cupido, M.E. Manso, and J. Sánchez, Nucl. Fusion 46 (2006) S792–S798

[4] T. Happel, T. Estrada, E. Blanco, V. Tribaldos, A. Cappa, and A. Bustos, Rev. Sci. Instrum. 80 (2009) 073502

[1]

[2]

[3]

[4]