4,422
edits
TJ-II:Heavy Ion Beam Probe: Difference between revisions
m
no edit summary
mNo edit summary |
mNo edit summary |
||
| Line 1: | Line 1: | ||
[[File: | [[File:TJ-II_HIBP_diagram.png|350px|thumb|right|HIBP probe diagram]] | ||
The advanced Heavy Ion Beam Probe can simulataneously measure the plasma electric potential ''φ'', the electron density ''n<sub>e</sub>'', the electron temperature ''T<sub>e</sub>'', and a poloidal magnetic field component ''B<sub>p</sub>'' at a point inside the plasma. | The advanced Heavy Ion Beam Probe can simulataneously measure the plasma electric potential ''φ'', the electron density ''n<sub>e</sub>'', the electron temperature ''T<sub>e</sub>'', and a poloidal magnetic field component ''B<sub>p</sub>'' at a point inside the plasma. | ||
<ref>L.I. Krupnik et al., Fusion Engineering and Design '''56-57''' (2001) 935</ref> | <ref>L.I. Krupnik et al., Fusion Engineering and Design '''56-57''' (2001) 935</ref> | ||
<ref>I.S. Bondarenko et al., Rev. Sci. Instrum. '''72''', 583 (2001)</ref> | <ref>I.S. Bondarenko et al., Rev. Sci. Instrum. '''72''', 583 (2001)</ref> | ||
This point can be scanned through the plasma cross-section by varying the deflection potentials. | This point can be scanned through the plasma cross-section by varying the deflection potentials (active beam control). | ||
== References == | == References == | ||
<references /> | <references /> | ||