TJ-II:Thomson Scattering - Revision history

Admin: Updated reference links

2018-04-03T16:05:16Z

Updated reference links

← Older revision		Revision as of 18:05, 3 April 2018
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	(located in [[TJ-II:Sectors\|sector]] D2, φ = 14.5°)		(located in [[TJ-II:Sectors\|sector]] D2, φ = 14.5°)
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	<ref>~~[http://link.aip.org/link/?RSINAK/70/763/1~~ C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>		<ref>C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', [[doi:10.1063/1.1149399\|Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]]</ref>
	<ref>~~[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715~~ J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-~~cortés~~, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plasmas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>		<ref>J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-Cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plasmas'', [[doi:10.1103/PhysRevLett.85.4715\|Phys. Rev. Lett. '''85''' (2000) 4715]]</ref>
	<ref>~~[http://link.aip.org/link/?RSINAK/72/3514/1~~ C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>		<ref>C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', [[doi:10.1063/1.1386896\|Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]]</ref>
	<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>		<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
	<ref>~~[http://dx.doi.org/10.1016/S0920-3796(03)00387-9~~ J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>		<ref>J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', [[doi:10.1016/S0920-3796(03)00387-9\|Fus. Eng. And Design, '''65''' (2003) 525-536]]</ref>
	<ref>~~[http://link.aip.org/link/?RSINAK/74/3998/1~~ B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>		<ref>B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', [[doi:10.1063/1.1597951\|Rev. Sci. Instrum. '''74''' (2003) 3998]]</ref>
	The laser chord is inclined by 17° from the vertical.		The laser chord is inclined by 17° from the vertical.

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	Some progress has also been made in the field of data analysis.		Some progress has also been made in the field of data analysis.
	<ref>~~[[doi:10.1016/j.fusengdes.2009.10.004\|~~L. Makili, J. Vega, S. Dormido-Canto, et al., ''Upgrade of the automatic analysis system in the TJ-II Thomson Scattering diagnostic: New image recognition classifier and fault condition detection'', Fusion Engineering and Design '''85''' (2010) 415–418]]</ref>		<ref>L. Makili, J. Vega, S. Dormido-Canto, et al., ''Upgrade of the automatic analysis system in the TJ-II Thomson Scattering diagnostic: New image recognition classifier and fault condition detection'', [[doi:10.1016/j.fusengdes.2009.10.004\|Fusion Engineering and Design '''85''' (2010) 415–418]]</ref>
	<ref>~~[[doi:10.1016/j.fusengdes.2012.04.004\|~~S. Dormido-Canto, G. Farias, J. Vega, I. Pastor, ''Image processing methods for noise reduction in the TJ-II Thomson Scattering diagnostic'', Fusion Engineering and Design (2012)]]</ref>		<ref>S. Dormido-Canto, G. Farias, J. Vega, I. Pastor, ''Image processing methods for noise reduction in the TJ-II Thomson Scattering diagnostic'', [[doi:10.1016/j.fusengdes.2012.04.004\|Fusion Engineering and Design (2012)]]</ref>

	== References ==		== References ==
	<references />		<references />

Admin at 06:57, 18 September 2012

2012-09-18T06:57:18Z

← Older revision		Revision as of 08:57, 18 September 2012
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	'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'.		'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'.

			== Data analysis ==

			Some progress has also been made in the field of data analysis.
			<ref>[[doi:10.1016/j.fusengdes.2009.10.004\|L. Makili, J. Vega, S. Dormido-Canto, et al., ''Upgrade of the automatic analysis system in the TJ-II Thomson Scattering diagnostic: New image recognition classifier and fault condition detection'', Fusion Engineering and Design '''85''' (2010) 415–418]]</ref>
			<ref>[[doi:10.1016/j.fusengdes.2012.04.004\|S. Dormido-Canto, G. Farias, J. Vega, I. Pastor, ''Image processing methods for noise reduction in the TJ-II Thomson Scattering diagnostic'', Fusion Engineering and Design (2012)]]</ref>

	== References ==		== References ==
	<references />		<references />

Admin at 06:39, 18 September 2012

2012-09-18T06:39:43Z

← Older revision		Revision as of 08:39, 18 September 2012
Line 5:		Line 5:
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>		<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
	<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator ~~plamsas~~'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>		<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plasmas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>
	<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>		<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
	<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>		<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>

Admin: Reverted edits by Otihizuv (Talk) to last revision by Admin

2010-11-24T11:22:02Z

Reverted edits by Otihizuv (Talk) to last revision by Admin

Otihizuv at 06:27, 24 November 2010

2010-11-24T06:27:13Z

Admin at 15:07, 28 August 2010

2010-08-28T15:07:52Z

← Older revision		Revision as of 17:07, 28 August 2010
Line 5:		Line 5:
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>		<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
			<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plamsas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>
	<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>		<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
	<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>		<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>

Admin at 10:14, 19 August 2010

2010-08-19T10:14:09Z

@@ Line 9: / Line 9: @@
 <ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>
 <ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
 The laser chord is inclined by 17&deg; from the vertical.
 The number of data points along the chord can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc; typically, it is of the order of 200. The estimated spatial resolution of diagnostic is approximately 2.4 mm.
 Due to a delay between the software trigger and the firing of the laser, the Thomson Scattering measurement occurs 6.4 ms after the trigger time stored in the database.

Admin at 10:40, 18 August 2010

2010-08-18T10:40:22Z

← Older revision		Revision as of 12:40, 18 August 2010
Line 10:		Line 10:
	<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>		<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
	The laser chord is inclined by 17° from the vertical.		The laser chord is inclined by 17° from the vertical.
	The number of data points along the chord can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.		The number of data points along the chord can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc; typically, it is of the order of 200. The estimated spatial resolution of diagnostic is approximately 2.4 mm.
	Due to a delay between the software trigger and the firing of the laser, the Thomson Scattering measurement occurs 6.4 ms after the trigger time stored in the database.		Due to a delay between the software trigger and the firing of the laser, the Thomson Scattering measurement occurs 6.4 ms after the trigger time stored in the database.
	Signal names in the [[TJ-II:Shot_database\|TJ-II database]]:		Signal names in the [[TJ-II:Shot_database\|TJ-II database]]:

Admin at 10:36, 18 August 2010

2010-08-18T10:36:28Z

← Older revision		Revision as of 12:36, 18 August 2010
Line 2:		Line 2:

	The high-resolution Thomson Scattering system		The high-resolution Thomson Scattering system
	(located in [[TJ-II:Sectors\|sector]] D2)		(located in [[TJ-II:Sectors\|sector]] D2, φ = 14.5°)
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>		<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
Line 9:		Line 9:
	<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>		<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>
	<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>		<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
	The number of data points along the ~~profiles~~ can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.		The laser chord is inclined by 17° from the vertical.
			The number of data points along the chord can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.
			Due to a delay between the software trigger and the firing of the laser, the Thomson Scattering measurement occurs 6.4 ms after the trigger time stored in the database.
	Signal names in the [[TJ-II:Shot_database\|TJ-II database]]:		Signal names in the [[TJ-II:Shot_database\|TJ-II database]]:
	'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'.		'PerfilRho_', 'PerfilTe_', 'PerfildTe_', 'PerfilNe_', 'PerfildNe_', 'PerfilPe_', 'PerfildPe_'.

Admin at 16:34, 9 August 2009

2009-08-09T16:34:07Z

← Older revision		Revision as of 18:34, 9 August 2009
Line 5:		Line 5:
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>		<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
	~~<ref>J. Herranz et al. Fus. Eng. And Design, '''65''' (2003) 525-536</ref>~~
	<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>		<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
	<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>		<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
			<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>
	<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>		<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
	The number of data points along the profiles can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.		The number of data points along the profiles can vary from shot to shot depending on magnetic configuration, the shape of actual plasma, the influence of stray light level on data quality, etc. The estimated spatial resolution of diagnostic is approximately 2.4 mm.

← Older revision		Revision as of 13:22, 24 November 2010
Line 1:		Line 1:
	~~=[http://axuzexy.co.cc UNDER COSTRUCTION, PLEASE SEE THIS POST IN RESERVE COPY]=~~
	[[File:Thomson.png\|400px\|thumb\|right\|The Thomson Scattering diagnostic at TJ-II]]		[[File:Thomson.png\|400px\|thumb\|right\|The Thomson Scattering diagnostic at TJ-II]]

	The high-resolution Thomson Scattering system		The high-resolution Thomson Scattering system
	(located in [[TJ-II:Sectors\|sector]] D2, &~~amp;~~phi; = 14.5&~~amp;~~deg;)		(located in [[TJ-II:Sectors\|sector]] D2, φ = 14.5°)
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	~~<~~ref~~>~~[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]~~<~~/ref~~>~~		<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
	~~<~~ref~~>~~[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plamsas'', Phys. Rev. Lett. '''85''' (2000) 4715]~~<~~/ref~~>~~		<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plamsas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>
	~~<~~ref~~>~~[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]~~<~~/ref~~>~~		<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
	~~<~~ref~~>~~J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI~~<~~/ref~~>~~		<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
	~~<~~ref~~>~~[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]~~<~~/ref~~>~~		<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>
	~~<~~ref~~>~~[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]~~<~~/ref~~>~~		<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
	The laser chord is inclined by 17&~~amp;~~deg; from the vertical.		The laser chord is inclined by 17° from the vertical.

	For reliable operation of the diagnostic, the parameters of the plasma should lie in the design range.		For reliable operation of the diagnostic, the parameters of the plasma should lie in the design range.
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	'''Wavelength calibration''': The spectrometer is illuminated with light coming from Helium and Argon spectral lamps, both having well documented, intense lines in the range from 550 to 850 nm.		'''Wavelength calibration''': The spectrometer is illuminated with light coming from Helium and Argon spectral lamps, both having well documented, intense lines in the range from 550 to 850 nm.

	'''Position calibration''': A set of &~~amp;~~sim; 20 carefully aligned pinholes, (diameter 300 microns, separation 20 mm), illuminated by a tungsten lamp, are imaged onto the spectrometer, to provide position calibration along the laser chord. In order to obtain the effective radius, the precise location of the laser chord and optical axis of the spectrometer with respect to TJII must be known. This measurement was performed when the system was first installed.		'''Position calibration''': A set of &sim; 20 carefully aligned pinholes, (diameter 300 microns, separation 20 mm), illuminated by a tungsten lamp, are imaged onto the spectrometer, to provide position calibration along the laser chord. In order to obtain the effective radius, the precise location of the laser chord and optical axis of the spectrometer with respect to TJII must be known. This measurement was performed when the system was first installed.

	'''Relative calibration''': This procedure is used to calibrate the relative response of the spectrometer as a function of wavelength and position. A tungsten-halogen lamp with a known, broad spectrum (black-body like) is used to this effect. The current in the lamp is kept constant by using a regulated power supply.		'''Relative calibration''': This procedure is used to calibrate the relative response of the spectrometer as a function of wavelength and position. A tungsten-halogen lamp with a known, broad spectrum (black-body like) is used to this effect. The current in the lamp is kept constant by using a regulated power supply.

	'''Absolute calibration''': in order to provide absolute density calibration, Rayleigh scattering with N~~<~~sub~~>~~2~~<~~/sub~~>~~, CO~~<~~sub~~>~~2~~<~~/sub~~>~~ or other gases has been used. This method is hard to implement in TJII due to the large amount of stray light entering the spectrometer that makes the evaluation of Rayleigh scattering signal from the gas problematic. Other techniques, like evaluation of the absolute density factor in profiles at or near to an ECRH cut-off have been tried. Regular comparisons with data from the interferometer can be used as a method to get the absolute density factor on profiles. The shape of the ''n~~<~~sub~~>~~e~~<~~/sub~~>~~'' profile is nevertheless robust, since it depends only on the relative calibration.		'''Absolute calibration''': in order to provide absolute density calibration, Rayleigh scattering with N<sub>2</sub>, CO<sub>2</sub> or other gases has been used. This method is hard to implement in TJII due to the large amount of stray light entering the spectrometer that makes the evaluation of Rayleigh scattering signal from the gas problematic. Other techniques, like evaluation of the absolute density factor in profiles at or near to an ECRH cut-off have been tried. Regular comparisons with data from the interferometer can be used as a method to get the absolute density factor on profiles. The shape of the ''n<sub>e</sub>'' profile is nevertheless robust, since it depends only on the relative calibration.

	== Data description ==		== Data description ==
Line 34:		Line 33:

	== References ==		== References ==
	~~<~~references /~~>~~		<references />

← Older revision		Revision as of 08:27, 24 November 2010
Line 1:		Line 1:
			=[http://axuzexy.co.cc UNDER COSTRUCTION, PLEASE SEE THIS POST IN RESERVE COPY]=
	[[File:Thomson.png\|400px\|thumb\|right\|The Thomson Scattering diagnostic at TJ-II]]		[[File:Thomson.png\|400px\|thumb\|right\|The Thomson Scattering diagnostic at TJ-II]]

	The high-resolution Thomson Scattering system		The high-resolution Thomson Scattering system
	(located in [[TJ-II:Sectors\|sector]] D2, φ = 14.5°)		(located in [[TJ-II:Sectors\|sector]] D2, &phi; = 14.5&deg;)
	provides electron temperature, density, and pressure profiles at a single time in the discharge.		provides electron temperature, density, and pressure profiles at a single time in the discharge.
	<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>		<ref>[http://link.aip.org/link/?RSINAK/70/763/1 C.J. Barth et al, ''High-resolution multiposition Thomson scattering for the TJ-II stellarator'', Rev. Sci. Instruments, Vol. '''70''', 1 (1999) 763-767]</ref>
	<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plamsas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>		<ref>[http://link.aps.org/doi/10.1103/PhysRevLett.85.4715 J. Herranz, I. Pastor, F. Castejón, E. de la Luna, I. García-cortés, C.J. Barth, E. Ascasíbar, J. Sánchez, and V. Tribaldos, ''Profile structures of TJ-II stellarator plamsas'', Phys. Rev. Lett. '''85''' (2000) 4715]</ref>
	<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>		<ref>[http://link.aip.org/link/?RSINAK/72/3514/1 C.J. Barth et al, ''Calibration procedure and data processing for a TV Thomson scattering system'', Rev. Sci. Instruments, Vol. '''72''', 9 (2001) 3514-3527]</ref>
	<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>		<ref>J. Herranz et al. ''Analysis of the Detection Process and Error Sources for the Thomson Scattering Profile Measurement in TJ-II''. Proc. issues of the 14th Topical Conf. on High Temperature Plasma Diagnostics, A.P.S., July 8, 2002, Madison, WI</ref>
	<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>		<ref>[http://dx.doi.org/10.1016/S0920-3796(03)00387-9 J. Herranz et al, ''The spectrometer of the high-resolution multiposition Thomson scattering diagnostic for TJ-II'', Fus. Eng. And Design, '''65''' (2003) 525-536]</ref>
	<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>		<ref>[http://link.aip.org/link/?RSINAK/74/3998/1 B.Ph. van Milligen et al, ''Revision of TV Thomson scattering data analysis and detection of profile structure'', Rev. Sci. Instrum. '''74''' (2003) 3998]</ref>
	The laser chord is inclined by 17° from the vertical.		The laser chord is inclined by 17&deg; from the vertical.

	For reliable operation of the diagnostic, the parameters of the plasma should lie in the design range.		For reliable operation of the diagnostic, the parameters of the plasma should lie in the design range.
Line 19:		Line 20:
	'''Wavelength calibration''': The spectrometer is illuminated with light coming from Helium and Argon spectral lamps, both having well documented, intense lines in the range from 550 to 850 nm.		'''Wavelength calibration''': The spectrometer is illuminated with light coming from Helium and Argon spectral lamps, both having well documented, intense lines in the range from 550 to 850 nm.

	'''Position calibration''': A set of &sim; 20 carefully aligned pinholes, (diameter 300 microns, separation 20 mm), illuminated by a tungsten lamp, are imaged onto the spectrometer, to provide position calibration along the laser chord. In order to obtain the effective radius, the precise location of the laser chord and optical axis of the spectrometer with respect to TJII must be known. This measurement was performed when the system was first installed.		'''Position calibration''': A set of &sim; 20 carefully aligned pinholes, (diameter 300 microns, separation 20 mm), illuminated by a tungsten lamp, are imaged onto the spectrometer, to provide position calibration along the laser chord. In order to obtain the effective radius, the precise location of the laser chord and optical axis of the spectrometer with respect to TJII must be known. This measurement was performed when the system was first installed.

	'''Relative calibration''': This procedure is used to calibrate the relative response of the spectrometer as a function of wavelength and position. A tungsten-halogen lamp with a known, broad spectrum (black-body like) is used to this effect. The current in the lamp is kept constant by using a regulated power supply.		'''Relative calibration''': This procedure is used to calibrate the relative response of the spectrometer as a function of wavelength and position. A tungsten-halogen lamp with a known, broad spectrum (black-body like) is used to this effect. The current in the lamp is kept constant by using a regulated power supply.

	'''Absolute calibration''': in order to provide absolute density calibration, Rayleigh scattering with N<sub>2</sub>, CO<sub>2</sub> or other gases has been used. This method is hard to implement in TJII due to the large amount of stray light entering the spectrometer that makes the evaluation of Rayleigh scattering signal from the gas problematic. Other techniques, like evaluation of the absolute density factor in profiles at or near to an ECRH cut-off have been tried. Regular comparisons with data from the interferometer can be used as a method to get the absolute density factor on profiles. The shape of the ''n<sub>e</sub>'' profile is nevertheless robust, since it depends only on the relative calibration.		'''Absolute calibration''': in order to provide absolute density calibration, Rayleigh scattering with N<sub>2</sub>, CO<sub>2</sub> or other gases has been used. This method is hard to implement in TJII due to the large amount of stray light entering the spectrometer that makes the evaluation of Rayleigh scattering signal from the gas problematic. Other techniques, like evaluation of the absolute density factor in profiles at or near to an ECRH cut-off have been tried. Regular comparisons with data from the interferometer can be used as a method to get the absolute density factor on profiles. The shape of the ''n<sub>e</sub>'' profile is nevertheless robust, since it depends only on the relative calibration.

	== Data description ==		== Data description ==
Line 33:		Line 34:

	== References ==		== References ==
	<references />		<references />